The Science and Information (SAI) Organization
  • Home
  • About Us
  • Journals
  • Conferences
  • Contact Us

Publication Links

  • IJACSA
  • Author Guidelines
  • Publication Policies
  • Digital Archiving Policy
  • Promote your Publication
  • Metadata Harvesting (OAI2)

IJACSA

  • About the Journal
  • Call for Papers
  • Editorial Board
  • Author Guidelines
  • Submit your Paper
  • Current Issue
  • Archives
  • Indexing
  • Fees/ APC
  • Reviewers
  • Apply as a Reviewer

IJARAI

  • About the Journal
  • Archives
  • Indexing & Archiving

Special Issues

  • Home
  • Archives
  • Proposals
  • Guest Editors
  • SUSAI-EE 2025
  • ICONS-BA 2025
  • IoT-BLOCK 2025

Future of Information and Communication Conference (FICC)

  • Home
  • Call for Papers
  • Submit your Paper/Poster
  • Register
  • Venue
  • Contact

Computing Conference

  • Home
  • Call for Papers
  • Submit your Paper/Poster
  • Register
  • Venue
  • Contact

Intelligent Systems Conference (IntelliSys)

  • Home
  • Call for Papers
  • Submit your Paper/Poster
  • Register
  • Venue
  • Contact

Future Technologies Conference (FTC)

  • Home
  • Call for Papers
  • Submit your Paper/Poster
  • Register
  • Venue
  • Contact
  • Home
  • Call for Papers
  • Editorial Board
  • Guidelines
  • Submit
  • Current Issue
  • Archives
  • Indexing
  • Fees
  • Reviewers
  • Subscribe

DOI: 10.14569/IJACSA.2022.0131159
PDF

A Novel Hierarchical Shape Analysis based on Sampling Point-Line Distance for Regular and Symmetry Shape Detection

Author 1: Kehua Xian

International Journal of Advanced Computer Science and Applications(IJACSA), Volume 13 Issue 11, 2022.

  • Abstract and Keywords
  • How to Cite this Article
  • {} BibTeX Source

Abstract: Regular and symmetry shapes occurred in natural and manufactured objects. Detecting these shapes are essential and still tricky task in computer vision. This paper proposes a novel hierarchical shape detection (HiSD) method, which consists of circularity and roundness detection, and regularity and symmetry detection phases. The first phase recognizes the circular and elliptical shapes using aspect ratio and roundness measurements. The second phase, the main phase in the HiSD, recognizes the regular and symmetry shapes using density distribution measurement (DDM) and the proposed sampling point-line distance distribution (SPLDD) algorithm. The proposed method presets effective with low computation cost shape detection approach which is not sensitive to specific category of objects. It enables to detect different types of objects involving the arbitrary, regular, and symmetry shapes. Experimental results show that the proposed method performs well compared to the existing state-of-the-art algorithms.

Keywords: Shape recognition; hierarchical shape detection; sampling point-line distance distribution; regular and symmetry shape detection

Kehua Xian, “A Novel Hierarchical Shape Analysis based on Sampling Point-Line Distance for Regular and Symmetry Shape Detection” International Journal of Advanced Computer Science and Applications(IJACSA), 13(11), 2022. http://dx.doi.org/10.14569/IJACSA.2022.0131159

@article{Xian2022,
title = {A Novel Hierarchical Shape Analysis based on Sampling Point-Line Distance for Regular and Symmetry Shape Detection},
journal = {International Journal of Advanced Computer Science and Applications},
doi = {10.14569/IJACSA.2022.0131159},
url = {http://dx.doi.org/10.14569/IJACSA.2022.0131159},
year = {2022},
publisher = {The Science and Information Organization},
volume = {13},
number = {11},
author = {Kehua Xian}
}



Copyright Statement: This is an open access article licensed under a Creative Commons Attribution 4.0 International License, which permits unrestricted use, distribution, and reproduction in any medium, even commercially as long as the original work is properly cited.

IJACSA

Upcoming Conferences

Computer Vision Conference (CVC) 2026

16-17 April 2026

  • Berlin, Germany

Healthcare Conference 2026

21-22 May 2025

  • Amsterdam, The Netherlands

Computing Conference 2025

19-20 June 2025

  • London, United Kingdom

IntelliSys 2025

28-29 August 2025

  • Amsterdam, The Netherlands

Future Technologies Conference (FTC) 2025

6-7 November 2025

  • Munich, Germany
The Science and Information (SAI) Organization
BACK TO TOP

Computer Science Journal

  • About the Journal
  • Call for Papers
  • Submit Paper
  • Indexing

Our Conferences

  • Computing Conference
  • Intelligent Systems Conference
  • Future Technologies Conference
  • Communication Conference

Help & Support

  • Contact Us
  • About Us
  • Terms and Conditions
  • Privacy Policy

© The Science and Information (SAI) Organization Limited. All rights reserved. Registered in England and Wales. Company Number 8933205. thesai.org