Heuristic Intelligent Algorithm-Based Approach for In-Depth Development and Application Analysis of Micro- and Nanoembedded Systems

Developing application analysis and testing methods is an important part of the in-depth development of micro-nano embedded systems under complex integrated architectures. Therefore, the research on application analysis and testing models is of great significance for the in-depth development and efficient design of embedded systems. In order to fully explore the effective information of test analysis data in the in-depth development of micro-nano embedded systems under complex integrated architectures and improve the analysis and prediction accuracy of test analysis models, a development test analysis model based on the photon search algorithm and LightGBM is proposed. First, the development process of micro-nano embedded systems under complex integrated architectures is analysed, and a system analysis architecture is designed to propose test analysis factors. Second, a development test analysis model is established by combining the photon search algorithm and LightGBM. Subsequently, the feasibility and efficiency of the model are proposed by analysing the data of the development process. The analysis of data examples shows that the LightGBM test analysis model has high analysis and prediction accuracy and generalisation performance.

@article{Liu2024,
  title     = {Heuristic Intelligent Algorithm-Based Approach for In-Depth Development and Application Analysis of Micro- and Nanoembedded Systems},
  journal   = {International Journal of Advanced Computer Science and Applications},
  volume    = {15},
  number    = {8},
  year      = {2024},
  publisher = {The Science and Information Organization},
  author    = {Buzhong Liu},
  doi       = {10.14569/IJACSA.2024.0150838},
  url       = {https://doi.org/10.14569/IJACSA.2024.0150838}
}