Theoretical and numerical characterization of continuously graded thin layer by the reflection acoustic microscope
DOI: https://doi.org/10.14569/IJACSA.2016.070279
Abstract
Keywords
How to Cite this Article
Markou, A., Nounah, H., & Mountassir, L. (2016). Theoretical and numerical characterization of continuously graded thin layer by the reflection acoustic microscope. International Journal of Advanced Computer Science and Applications, 7(2). https://doi.org/10.14569/IJACSA.2016.070279
Markou, Ahmed, et al.. "Theoretical and numerical characterization of continuously graded thin layer by the reflection acoustic microscope." International Journal of Advanced Computer Science and Applications, vol. 7, no. 2, 2016, https://doi.org/10.14569/IJACSA.2016.070279.
@article{Markou2016,
title = {Theoretical and numerical characterization of continuously graded thin layer by the reflection acoustic microscope},
journal = {International Journal of Advanced Computer Science and Applications},
volume = {7},
number = {2},
year = {2016},
publisher = {The Science and Information Organization},
author = {Ahmed Markou and Hassan Nounah and Lahcen Mountassir},
doi = {10.14569/IJACSA.2016.070279},
url = {https://doi.org/10.14569/IJACSA.2016.070279}
}
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