SAM-PIE: SAM-Enabled Photovoltaic-Module Image Enhancement for Fault Inspection and Analysis Using ResNet50 and CNNs
DOI: https://doi.org/10.14569/IJACSA.2024.0151132
Abstract
Keywords
How to Cite this Article
Bello, R., Owolawi, P. A., Wyk, E. A. v., & Du, C. (2024). SAM-PIE: SAM-Enabled Photovoltaic-Module Image Enhancement for Fault Inspection and Analysis Using ResNet50 and CNNs. International Journal of Advanced Computer Science and Applications, 15(11). https://doi.org/10.14569/IJACSA.2024.0151132
Bello, Rotimi-Williams, et al.. "SAM-PIE: SAM-Enabled Photovoltaic-Module Image Enhancement for Fault Inspection and Analysis Using ResNet50 and CNNs." International Journal of Advanced Computer Science and Applications, vol. 15, no. 11, 2024, https://doi.org/10.14569/IJACSA.2024.0151132.
@article{Bello2024,
title = {SAM-PIE: SAM-Enabled Photovoltaic-Module Image Enhancement for Fault Inspection and Analysis Using ResNet50 and CNNs},
journal = {International Journal of Advanced Computer Science and Applications},
volume = {15},
number = {11},
year = {2024},
publisher = {The Science and Information Organization},
author = {Rotimi-Williams Bello and Pius A. Owolawi and Etienne A. van Wyk and Chunling Du},
doi = {10.14569/IJACSA.2024.0151132},
url = {https://doi.org/10.14569/IJACSA.2024.0151132}
}
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